DIFFERENTIAL CALIBRATION SUBSTRATES
Calibration Substrates(Differential Calibration Substrate Selection Guide GSGSG)
for probe tip calibration – available in 9 standard models
Our accurate, easy to use calibration substrates, calibration coefficients, and detailed instructions allow you to correct the measurement system (network analyzer + cabling + probe) whenever it produces a reading different than the standard. The typical elements for calibrating a microwave measurement system consists of opens, shorts, matched loads, and throughs. These four elements have electrical characteristics that are very different from one another so that each element contributes an important part to the overall calibration process. In principle any set of standards could be employed, however, the more identical the standards are, the less accurate the calibration process becomes, which in turn results in inaccurate the on-wafer testing. Our precision crafted calibration substrates, when properly used, assure you of accurate on-wafer test results.
